x-ray diffractometer equipped with an automatic divergent slit Search Results


divergent beam x-ray powder diffractometer  (National Institute of Standards and Technology)
90
National Institute of Standards and Technology divergent beam x-ray powder diffractometer
Divergent Beam X Ray Powder Diffractometer, supplied by National Institute of Standards and Technology, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x-ray+diffractometer+equipped+with+an+automatic+divergent+slit/divergent+beam+x+ray+powder+diffractometer/10__6028_slash_jres__125__020-483-31-5
Average 90 stars, based on 1 article reviews
divergent beam x-ray powder diffractometer - by Bioz Stars, 2026-09
90/100 stars
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panalytical empyrean x ray diffractometer  (Malvern Panalytical)
99
Malvern Panalytical panalytical empyrean x ray diffractometer
Panalytical Empyrean X Ray Diffractometer, supplied by Malvern Panalytical, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x-ray+diffractometer+equipped+with+an+automatic+divergent+slit/Empyrean/10__1016_slash_j__mtcomm__2021__102657-66-8-8
Average 99 stars, based on 1 article reviews
panalytical empyrean x ray diffractometer - by Bioz Stars, 2026-09
99/100 stars
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xrd  (Bruker Corporation)
99
Bruker Corporation xrd
Figure 1. Material characterization of 1T MoS2 and LixMoS2 nanosheets in comparison to bulk 2H MoS2. <t>(a)</t> <t>Raman</t> spectra showing E2g 1 (in- plane; 382 cm−1) and A1g (out-of-plane; 406 cm−1) peaks, 1T features (J1, J2, and J3 peaks at 153, 220, and 325 cm−1) and c peak at 250 cm−1. (b) <t>XRD</t> patterns showing a new (001) peak at 7.8°, suggesting 2H to 1T phase transformation and an increase in interlayer spacing. (c) Deconvoluted high-resolution Mo 3d XPS spectra, showing ∼74% 1T phase concentration for 1T MoS2 nanosheets, and ∼79% for LixMoS2 nanosheets.
Xrd, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x-ray+diffractometer+equipped+with+an+automatic+divergent+slit/D8+ADVANCE/10__1021_slash_acs__chemmater__4c00674-168-18-19
Average 99 stars, based on 1 article reviews
xrd - by Bioz Stars, 2026-09
99/100 stars
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x’pertpro mpd diffractometer  (PANalytical)
90
PANalytical x’pertpro mpd diffractometer
Figure 1. Material characterization of 1T MoS2 and LixMoS2 nanosheets in comparison to bulk 2H MoS2. <t>(a)</t> <t>Raman</t> spectra showing E2g 1 (in- plane; 382 cm−1) and A1g (out-of-plane; 406 cm−1) peaks, 1T features (J1, J2, and J3 peaks at 153, 220, and 325 cm−1) and c peak at 250 cm−1. (b) <t>XRD</t> patterns showing a new (001) peak at 7.8°, suggesting 2H to 1T phase transformation and an increase in interlayer spacing. (c) Deconvoluted high-resolution Mo 3d XPS spectra, showing ∼74% 1T phase concentration for 1T MoS2 nanosheets, and ∼79% for LixMoS2 nanosheets.
X’pertpro Mpd Diffractometer, supplied by PANalytical, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x-ray+diffractometer+equipped+with+an+automatic+divergent+slit/x+ray+diffractometer/10__1039_slash_c6sm01804a-35-11-10
Average 90 stars, based on 1 article reviews
x’pertpro mpd diffractometer - by Bioz Stars, 2026-09
90/100 stars
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xrd siemens d5000 diffractometer  (Siemens AG)
90
Siemens AG xrd siemens d5000 diffractometer
Figure 1. Material characterization of 1T MoS2 and LixMoS2 nanosheets in comparison to bulk 2H MoS2. <t>(a)</t> <t>Raman</t> spectra showing E2g 1 (in- plane; 382 cm−1) and A1g (out-of-plane; 406 cm−1) peaks, 1T features (J1, J2, and J3 peaks at 153, 220, and 325 cm−1) and c peak at 250 cm−1. (b) <t>XRD</t> patterns showing a new (001) peak at 7.8°, suggesting 2H to 1T phase transformation and an increase in interlayer spacing. (c) Deconvoluted high-resolution Mo 3d XPS spectra, showing ∼74% 1T phase concentration for 1T MoS2 nanosheets, and ∼79% for LixMoS2 nanosheets.
Xrd Siemens D5000 Diffractometer, supplied by Siemens AG, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x-ray+diffractometer+equipped+with+an+automatic+divergent+slit/siemens+d5000+diffractometer/10__1016_slash_j__colsurfa__2015__05__031-61-9-12
Average 90 stars, based on 1 article reviews
xrd siemens d5000 diffractometer - by Bioz Stars, 2026-09
90/100 stars
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x ray diffractometer  (Philips Healthcare)
86
Philips Healthcare x ray diffractometer
Figure 1. Material characterization of 1T MoS2 and LixMoS2 nanosheets in comparison to bulk 2H MoS2. <t>(a)</t> <t>Raman</t> spectra showing E2g 1 (in- plane; 382 cm−1) and A1g (out-of-plane; 406 cm−1) peaks, 1T features (J1, J2, and J3 peaks at 153, 220, and 325 cm−1) and c peak at 250 cm−1. (b) <t>XRD</t> patterns showing a new (001) peak at 7.8°, suggesting 2H to 1T phase transformation and an increase in interlayer spacing. (c) Deconvoluted high-resolution Mo 3d XPS spectra, showing ∼74% 1T phase concentration for 1T MoS2 nanosheets, and ∼79% for LixMoS2 nanosheets.
X Ray Diffractometer, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x-ray+diffractometer+equipped+with+an+automatic+divergent+slit/diffractometer+ray+x/10__9734_slash_acsj_slash_2016_slash_23161-73-13-20
Average 86 stars, based on 1 article reviews
x ray diffractometer - by Bioz Stars, 2026-09
86/100 stars
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x ray diffraction  (Philips Healthcare)
86
Philips Healthcare x ray diffraction
Figure 1. Material characterization of 1T MoS2 and LixMoS2 nanosheets in comparison to bulk 2H MoS2. <t>(a)</t> <t>Raman</t> spectra showing E2g 1 (in- plane; 382 cm−1) and A1g (out-of-plane; 406 cm−1) peaks, 1T features (J1, J2, and J3 peaks at 153, 220, and 325 cm−1) and c peak at 250 cm−1. (b) <t>XRD</t> patterns showing a new (001) peak at 7.8°, suggesting 2H to 1T phase transformation and an increase in interlayer spacing. (c) Deconvoluted high-resolution Mo 3d XPS spectra, showing ∼74% 1T phase concentration for 1T MoS2 nanosheets, and ∼79% for LixMoS2 nanosheets.
X Ray Diffraction, supplied by Philips Healthcare, used in various techniques. Bioz Stars score: 86/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/x-ray+diffractometer+equipped+with+an+automatic+divergent+slit/diffraction+ray+x/10__1016_slash_j__fuel__2006__11__043-43-6-8
Average 86 stars, based on 1 article reviews
x ray diffraction - by Bioz Stars, 2026-09
86/100 stars
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Image Search Results


Figure 1. Material characterization of 1T MoS2 and LixMoS2 nanosheets in comparison to bulk 2H MoS2. (a) Raman spectra showing E2g 1 (in- plane; 382 cm−1) and A1g (out-of-plane; 406 cm−1) peaks, 1T features (J1, J2, and J3 peaks at 153, 220, and 325 cm−1) and c peak at 250 cm−1. (b) XRD patterns showing a new (001) peak at 7.8°, suggesting 2H to 1T phase transformation and an increase in interlayer spacing. (c) Deconvoluted high-resolution Mo 3d XPS spectra, showing ∼74% 1T phase concentration for 1T MoS2 nanosheets, and ∼79% for LixMoS2 nanosheets.

Journal: Chemistry of Materials

Article Title: Environmental and Thermal Stability of Chemically Exfoliated LixMoS2 for Lithium–Sulfur Batteries

doi: 10.1021/acs.chemmater.4c00674

Figure Lengend Snippet: Figure 1. Material characterization of 1T MoS2 and LixMoS2 nanosheets in comparison to bulk 2H MoS2. (a) Raman spectra showing E2g 1 (in- plane; 382 cm−1) and A1g (out-of-plane; 406 cm−1) peaks, 1T features (J1, J2, and J3 peaks at 153, 220, and 325 cm−1) and c peak at 250 cm−1. (b) XRD patterns showing a new (001) peak at 7.8°, suggesting 2H to 1T phase transformation and an increase in interlayer spacing. (c) Deconvoluted high-resolution Mo 3d XPS spectra, showing ∼74% 1T phase concentration for 1T MoS2 nanosheets, and ∼79% for LixMoS2 nanosheets.

Article Snippet: ■ MATERIAL CHARACTERIZATION The materials were characterized by Raman spectroscopy (Renishaw InVia using a 514 nm laser beam), XRD (Bruker D8 Advance powder X-ray diffractometer using Cu Kα radiation, equipped with automatic divergence slits and a LynxEye-XE position sensitive detector), XPS (ThermoFisher Scientific using an Al Kα source), ICP-MS (Perkinelmer NEXION 350D), TGA (TA Instruments Discovery SDT650), MDSC (TA Instruments Q2000 DSC), and TEM (FEI Tecnai F20, 200 kV).

Techniques: Comparison, Transformation Assay, Concentration Assay

Figure 5. Comparison of (a) XRD patterns and (b) Raman spectra of as-synthesized LixMoS2 nanosheets and LixMoS2 exposed to dry and humid air for 48 h. LixMoS2 exposed to humid air shows peaks at 19.8 and 21.1°, which are characteristic peaks of Li2MoO4. The Raman spectra of both samples show features unique to the 1T phase. However, the sample exposed to humid air lost intensity for J1 and J3 and did not retain the c peak located at 250 cm−1.

Journal: Chemistry of Materials

Article Title: Environmental and Thermal Stability of Chemically Exfoliated LixMoS2 for Lithium–Sulfur Batteries

doi: 10.1021/acs.chemmater.4c00674

Figure Lengend Snippet: Figure 5. Comparison of (a) XRD patterns and (b) Raman spectra of as-synthesized LixMoS2 nanosheets and LixMoS2 exposed to dry and humid air for 48 h. LixMoS2 exposed to humid air shows peaks at 19.8 and 21.1°, which are characteristic peaks of Li2MoO4. The Raman spectra of both samples show features unique to the 1T phase. However, the sample exposed to humid air lost intensity for J1 and J3 and did not retain the c peak located at 250 cm−1.

Article Snippet: ■ MATERIAL CHARACTERIZATION The materials were characterized by Raman spectroscopy (Renishaw InVia using a 514 nm laser beam), XRD (Bruker D8 Advance powder X-ray diffractometer using Cu Kα radiation, equipped with automatic divergence slits and a LynxEye-XE position sensitive detector), XPS (ThermoFisher Scientific using an Al Kα source), ICP-MS (Perkinelmer NEXION 350D), TGA (TA Instruments Discovery SDT650), MDSC (TA Instruments Q2000 DSC), and TEM (FEI Tecnai F20, 200 kV).

Techniques: Comparison, Synthesized